KYEC My Fab
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Wafer Probing Final Test Burn-in System Level Testing (SLT) Back end service

King Yuan Electronics Co., Ltd. (KYEC) provides a broad range of test platforms for wafer testing solutions. The test temperature ranges from -55°C to 150°C, capable of testing 6-, 8-, and 12-inch wafers. Cleanroom testing environments are categorized into Class 10, Class 100, Class 1,000, and Class 10,000.

Other services available:

  • Laser Repair
  • Wafer Level Burn In
  • Wafer Level Cycling

Probe Card In-house Maintenance:

  • Cantilever, Vertical or MEMS Probe Cards
  • High Parallelism Probe Cards up to 256 DUT
  • High Pin Count Probe Cards over 64,000 probes
  • Fine Pitch Probe Card: min pitch 43um
  • Probe Card Analyzer: PRV/4, PB6500

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