Design-to-Test Solutions Provider.KYEC's capability includes complete...
At KYEC we provide a wide range of test platforms for wafer probe / testing solutions.
Wafer probe temperature ranges from -55 ° C – 150 ° C with capability of handling 5, 6, 8 & 12" wafers. Both wafer map (inkless process) and off-line ink processes are available.
Wafer Level Burn In
Wafer Level Cycling
Wafer probe is performed in the class 100 for CIS / CCD and class 1K for other devices.
KYEC has in-house capability to design, repair & re-build probe card.
Vertical and Cantilever Probe Cards
256 DUT memory probe card
Fine Pitch LCD probe card
Alignment and Contact Resistance/Leakage Measurement