Test Data/ Yield Analysis
KYEC deploy 3 methods to monitor the process Conventional Travel Card All items as per customers yield criteria are checked and data logged manually. On-Line Monitoring System (OMS) Automatic monitoring of yield ,SBC and site –unbalance in wafer base that triggers instruction steps to alert operator to trouble shoot. CP System KYEC’s main Data Management System provide yield monitoring , data transfer and all other criteria as per customer specs.
All items as per customers yield criteria are checked and data logged manually.
