Memory
Digital
Logic & Mixed-Signal
LCD Driver
CIS / CCD
RF
SOC
 


 





 

Test Platform Conversion
KYEC has the capability to accept Verilog HDL , WGL , STIL test pattern formats.
With KYEC's internally developed tools coupled with the Test Technology Expertise , we are able to convert the various test pattern to the selected test platform.
The services available includes:
Fault Simulation
Test Pattern Synthesis
Test Pattern Conversion to selected test platform




 

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