KYEC offers a complete range of test platforms that meets the needs of CIS and CCD production testing requirement. Our solutions include CMOS Image Sensor, DPS/EMBED DRAM Image Sensor, CCD Image Sensor, high resolution Image Sensor, high speed Image Sensor and high integration SOC Image Sensor. The end product applications that we support are Cameras, Cellular Phones, DSC and DV.

KYEC has vast experience with CCD/CMOS high resolution devices and is capable of developing test program, probe card and load board design & development. The test technique solutions include:

Pupil module solution

Linear CCD 8 sites

CSP FT test solution

Area image sensor multi-sites

Low temperature test solution

A complete range of test platforms are available to support a full range of CIS / CCD test requirements

Vendor Model Speed(MHz)
Advantest HP93000IP 200/400/660Mbps
HP94000IP 128MHz
Teradyne IP750/IP750EX 100MHz/200MHz
KYEC in-house tester I1000/I2000 100MHz/200MHz