At KYEC we provide a wide range of test platforms for wafer probe / testing solutions.
Wafer probe temperature ranges from -55 ° C – 150 ° C with capability of handling 5, 6, 8 & 12" wafers. Both wafer map (inkless process) and off-line ink processes are available.

Other service available at wafer probe includes:

Laser Repair

Wafer Level Burn In

Wafer Level Cycling

Wafer probe is performed in the class 100 for CIS / CCD and class 1K for other devices.
KYEC has in-house capability to design, repair & re-build probe card.

Our probe card in-house maintenance covers:

Vertical and Cantilever Probe Cards

256 DUT memory probe card

Fine Pitch LCD probe card

Alignment and Contact Resistance/Leakage Measurement

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