As a customer of KYEC you will have full access to value added services such as our e-Fab. KYEC's e-Fab is a highly advanced Virtual Factory portal through which you can access information concerning your product test results, browse analysis reports, or track the logistical progress of your devices. All this information are presented to you in a user friendly manner.

Once securely logged in, the user can access the Logistics and Engineering Data Analysis (EDA) portals to navigate through an advanced array of services, support and information relating to their products.

In Logistics, the user can access information online regarding the Work In Progress (WIP) status of their devices, track work schedules and view the product's current testing process flow. In addition, customers can view logistical information in the SHIP portal about the delivery status of their products.

In the EDA portal a user can access information and services in relation to Chip Probing (CP) EDA and Final Test (FT) EDA.

CP EDA contains information which relates to the Lot Summary, Wafer Map, Trend Chart, Test Reports, Search Lot and Advanced Search. The Lot Summary provides information on the process yield for a Lot query and more detailed good wafer percentage yields can also be viewed. The Wafer Map shows the good and bad die test results for each individual die on the wafer. Trend Chart provides statistical information relating to product test results in the form of interactive analysis charts. The Report section provides executive style reports on the overall test results. Search Lot and Advanced Search give users access to search engines which can quickly deliver results based on a customer's search criteria.

FT EDA has sections displaying information on LotSum (HBIN), TrendChart (HBIN), LotSum (SBIN) and TrendChart (SBIN). LotSum (HBIN) provides the user with Lot Summary information concerning the hard bin and the yield percentage, type of tester used, total quantity tested and pass quantity. TrendChart (HBIN) presents the results to the user in the form of interactive analysis charts. LotSum (SBIN) provides the user with Lot Summary information concerning the soft bin and the yield percentage, type of tester used total quantity tested and pass quantity. TrendChart (SBIN) presents the results to the user in the form of interactive analysis charts.

 

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