 SOC系統整合晶片測試 |
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| KYEC has the capability to provide the complete range of testing, diagnosis, verification, characterization and debugging services for complex SOC devices such as ASIC and ASSP. Our highly efficient testing processes are performed block by block to ensure 100% electrical testing. We have the capability of specifying the test speed, fault coverage, diagnostic options and test time to ensure that all operating conditions are reproduced and all faults exposed and fully debugged. |
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A complete range of test platforms are available to support a full range of SOC系統整合晶片
test requirements . |
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