KYEC offers a complete range of test platforms that meets the needs of CIS and CCD production testing requirement. Our solutions include CMOS Image Sensor, DPS/EMBED DRAM Image Sensor, CCD Image Sensor, high resolution Image Sensor, high speed Image Sensor and high integration SOC Image Sensor. The end product applications that we support are Cameras, Cellular Phones, DSC and DV.

KYEC has vast experience with CCD/CMOS high resolution devices and is capable of developing test program, probe card and load board design & development. The test technique solutions include:
Pupil module solution
Linear CCD 8 sites
CSP FT test solution
Area image sensor multi-sites
Low temperature test solution
Image sensor burn in solution