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 Test Data/ Yield Analysis 
KYEC deploy 3 methods to monitor the process
 Conventional Travel Card
 All items as per customers yield criteria are checked and data logged manually.
On-Line Monitoring System (OMS)
Automatic monitoring of yield ,SBC and site –unbalance in wafer base that triggers
instruction steps to alert operator to trouble shoot.
CP System
KYEC’s main Data Management System provide yield monitoring , data transfer and all
other criteria as per customer specs.
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