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邏輯&混合訊號IC測試
LCD Driver驅動IC測試
CIS / CCD IC測試
RF無線射頻IC測試
SOC系統整合晶片測試
 


 





 

Test Platform Conversion

KYEC has the capability to accept Verilog HDL , WGL , STIL test pattern formats. With KYEC's internally developed tools coupled with the Test Technology Expertise , we are able to convert the various test pattern to the selected test platform.

The services available includes:
Fault Simulation
Test Pattern Synthesis
Test Pattern Conversion to selected test platform

 

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